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Major systems integrators support Anite’s Propsim channel emulators to speed up MIMO OTA device testing
   

FAST-OTA capability enables device manufacturers to accelerate MIMO OTA R&D and CTIA pre-certification testing by more than ten times

Anite, a global leader in wireless equipment testing technology, has today announced that major systems integrators, including ETS-Lindgren, will support the FAST-OTA capability in Anite’s Propsim channel emulators to speed up mobile device MIMO OTA testing performed in anechoic chambers.

CTIA published a MIMO OTA performance test plan last year in which they recommend that MIMO OTA testing should be performed using a multi-probe (Multiple Cluster) methodology (AC-MC) in an anechoic chamber, together with a channel emulator. The innovative FAST-OTA capability allows users such as chipset vendors, device manufacturers and test houses to reduce device pre-certification testing time in the development phase from three hours to just over fifteen minutes per LTE frequency band, compared to when conventional testing methods are being used.

Since device manufacturers need to verify the performance of a device across multiple radio frequency bands, users of Propsim’s FAST-OTA capability are able to make significant savings in both time and resources. Anite’s FAST-OTA capability integrates with system control software supplied by major anechoic chamber systems manufacturers, such as ETS-Lindgren, who have already verified its functionality.

Bryan Sayler, Sr. Vice President, Solutions Development at ETS-Lindgren commented: “Anite’s FAST-OTA capability offers device manufacturers the option to collect pre-compliant MIMO OTA data in less time. We support this additional capability so that device manufacturers can reduce the time and cost in R&D device evaluation.”

Paul Beaver, Products Director at Anite’s Device & Infrastructure Testing business commented: “The introduction of this unique capability demonstrates Anite’s leadership in developing innovative and efficient performance test solutions that help users accelerate device introduction and reduce R&D cost.”

  
   
   
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